SEM Magnification Standard and Stage Micrometer MRS-4 - Magnification Reference Standards

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SEM Magnification Standard and Stage Micrometer MRS-4 - Magnification Reference StandardsDESCRIPTION MRS 4 Reference Standard, X, Not Traceable, without Protective Retainer, Unmounted MRS 4 Reference Standard, X Y, Traceable, without Protective Retainer, Unmounted MRS 4 Reference Standard, X Y Z, Traceable, without Protective Retainer, Unmounted The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron

but also incredibly easy to use

model SD-101

in both SE and BSE mode

Made on a 400 square mesh

Record Card included

Tilt-Compensated High Aspect Ratio (5:1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall/deep geometries

Gold coating on the tip side makes functionalizing the tip easier (e

p-type staircase (SSRM-SMPL-P) and Oxide sample (SSRM-SMPL-OX) also available separately

Gold Plated

slimmest shanks

and unmounted

Above this temperature it becomes almost insoluble